Title | A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks |
Publication Type | Journal Article |
Authors | Barenghi, A., C. Hocquet, D. Bol, F-X. Standaert, F. Regazzoni, and I. Koren |
Title | A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks |
Publication Type | Journal Article |
Authors | Barenghi, A., C. Hocquet, D. Bol, F-X. Standaert, F. Regazzoni, and I. Koren |